Combination measurement workstation that runs spectral attenuation, mode field diameter and cut-off wavelength in a single characterization sequence.

The WS500 bundles several fiber characterization measurements into one configurable instrument so they can be executed as a single sequence: spectral attenuation, mode field diameter (with Aeff) and cut-off wavelength, for single-mode and multimode fiber, components and cables. Broad-band SLED sources cover 1250-1650 nm, supported by a low-power tungsten lamp for long life, and MFD is measured with a far-field scanner. Options add multimode numerical aperture via an 850 nm broad-band LED into the far-field scanning method, and macrobending loss using pre-defined mandrel diameters with sequential measurement at different bend radii over a programmable wavelength range.
| Parameter | Value |
|---|---|
| Standard measurement types | Spectral attenuation, mode field diameter (MFD), effective area (Aeff), cut-off wavelength |
| Spectral coverage (broad-band SLED sources) | 1250-1650 nm |
| Numerical aperture option - LED wavelength | 850 nm |
| Secondary light source | Low power tungsten lamp |
| MFD measurement method | Far-field scanner |
| Standards compliance | IEC-60793-1-40, IEC-60793-1-43, IEC-60793-1-44, IEC-60793-1-45, IEC-60793-1-47, IEC-60793-2-50 (C5), IEC-TR-62284, ITU G650.1, ITU G650.2 |
| Applicable fiber types | NDS, NZDS, DC, bend-insensitive variants; single-mode and multimode fiber, components and cables |
| Attenuation dynamic range | — |
| MFD measurement range | — |
| Cut-off wavelength measurement range | — |
| Mandrel diameters (macrobending option) | — |

A shared cabinet holding several Bola Configurable instruments with configured interconnects, assembled to a customer's requirements. Single mode and multimode instruments can be combined in the same cabinet.

Customer-defined optical test sets built, integrated and tested to a specification, combining Bola instruments with third-party optical components. Targeted at manufacturing transceiver test in O-band, C-band and 850 nm.

A plugin-based integration that brings SGTR interrogator data into the Gantner Instruments data acquisition ecosystem.
Our application engineers will confirm specifications with the manufacturer and quote for your configuration.
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