A0010A RIN Measurement System
A benchtop system that measures the relative intensity noise (RIN) of laser diodes, pairing a SYCATUS optical receiver with a Keysight X-Series signal analyzer. SYCATUS states measurement bandwidth options up to 40 GHz on the product page and up to 50 GHz in the datasheet.
Technical overview
The system converts light from the device under test to an amplified electrical signal in a SYCATUS optical receiver; the noise power density of that signal is measured by a Keysight X-Series signal analyzer, while a Keysight digital multimeter monitors the photocurrent. SYCATUS states it applies its own calibration technique across the whole chain, from the optical receiver input to the analyzer display, to make the RIN reading accurate and repeatable. The measurement software runs inside the signal analyzer, so no external PC is required. Bandwidth, fibre interface (single-mode or multimode) and an optional optical-modulation-index measurement are selected by ordering option.
Features
- RIN (Relative Intensity Noise) measurement with the world's widest 50 GHz bandwidth
- Wide wavelength range of 800-1625 nm with SM/MM selection
- High sensitivity <-160 dB/Hz based on unique and accurate calibration
- Noise characterization of lasers for optical TX up to 1.6 Tb/s
- Unique and accurate calibration for uncertainty reduction
- RIN OMA measurements in accordance with IEEE standards
- Measurement software installed in the signal analyzer; no external PC required
Specifications
| Parameter | Value |
|---|---|
| Optical wavelength (multimode interface) | 780 to 1625 nm |
| Optical wavelength (single-mode interface) | 1260 to 1625 nm |
| Measurement frequency, 3 GHz model | 100 kHz to 3 GHz Hz |
| Measurement frequency, 20 GHz model | 10 MHz to 20 GHz Hz |
| Measurement frequency, 26.5 GHz model | 100 MHz to 26.5 GHz Hz |
| Measurement frequency, 40 GHz model | 500 MHz to 40 GHz Hz |
| Measurement frequency, 50 GHz model (datasheet only; not listed on the product page) | 10 MHz to 50 GHz Hz |
| Optical input power, max, 3 GHz SM model | 10 mW |
| Optical input power, max, 20 GHz SM model | 10 mW |
| Optical input power, max, 20 GHz MM model | 5 mW |
| Optical input power, max, 26.5 GHz SM/MM model | 5 mW |
| Optical input power, max, 40 GHz SM model | 5 mW |
| Minimum measurable RIN value, typ., 3 GHz SM model | -160 dB/Hz |
| Minimum measurable RIN value, typ., 20 GHz SM model | -160 dB/Hz |
| Minimum measurable RIN value, typ., 20 GHz MM model | -157 dB/Hz |
| Minimum measurable RIN value, typ., 26.5 GHz SM/MM model | -157 dB/Hz |
| Minimum measurable RIN value, typ., 40 GHz SM model | -157 dB/Hz |
| Minimum measurable RIN value, typ., 50 GHz model (datasheet only; stated at 1 mW optical input, with a footnote of -154 dB/Hz for the M40 model above 30 GHz and the 050 model above 40 GHz) | -157 dB/Hz |
| Input optical modulation amplitude range, OMI option (datasheet only) | 0.7 mW p-p |
| Optical modulation index accuracy, OMI option, relative error at -10 dBm optical input and 10 % OMI (datasheet only; typ. 5, max. 15) | 5 to 15 % |
Applications
- Laser diode noise characterization for high-speed optical transmitters
- Noise characterization of lasers for optical TX up to 1.6 Tb/s
- RIN-OMA testing to IEEE 802.3 standards
- Development, manufacturing and quality control of laser diodes
- Evaluation of multi-wavelength and highly integrated laser diodes
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